|
|
| |
|
|
|
|
|
|
 Click to enlarge image
|
Features
- Hyper Test Site
- Expandability - more pins or resources
- Test Operation Not Language operation
- Total Solution for CP testing
- Low cost per site
- Tiny floor space
Specifications
EX-20 [Image Sensor Tester]
- 32 sets of resources
- Up to 32 sites
- 80MHz/512ch
- Up to128 DPS
- 32 device sites
- Hybrid pins
- Light sources
- Device power supplies
- UCB/User consoles
- DSP to process
EX-22 [ LDI Tester ]
- Up to 16 sites
- 160MHz
- Per pin digitalizer
- Digital-Up to 256ch
- Analog-Up to 2,048ch
- Device power supplies 64
- DSP to process
EX-23 [ Logic Tester ]
- Up to 32 sites
- 20MHz / 768ch
- Per pin LMU / Per pin PMU
- Pattern depth - 64M
- USB
EX-24 [ Discrete Tester ]
- Up to 32 sites
- 256ch
- Per pin PMU
- 20A / 600V
- UCB
|
|
|
|
| |
|
|
|
Related Keywords:
Bookmark / Share this page